| Tektronix’s most accurate Superspeed USB test solution |
| Posted: May 2009 | ||||||
Tektronix, a US-based provider of test, measurement and monitoring instrumentation,
announced a new comprehensive toolset for characterisation, debug and automated compliance test of Superspeed USB (USB 3.0) devices. The new Option USB-TX with the DPO/DSA70000B Oscilloscope provides an automated one-button solution to validate USB 3.0 transmitter devices — enabling engineers a more efficient way to bring their designs to market. The company also has introduced a full set of USB 3.0 test fixtures that allows engineers to perform more accurate transmitter, receiver and cable testing. Driven by the continuous need for faster data transmissions, the 10x performance improvement over current USB solutions provided by USB 3.0 creates multiple challenges for system and circuit designers. The increased bandwidth brings with it critical signal-transmission and signal-fidelity challenges that require highly accurate and versatile test solutions. While other industry offerings provide only normative measurements per the USB-IF electrical test specification, the Tektronix Option USB-TX supports all measurements including normative and informative tests such as Spread Spectrum Clocking (SSC), Slew and Voltage Levels. This enables customers to have full confidence in their design-validation processes.
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Tektronix, a US-based provider of test, measurement and monitoring instrumentation,
announced a new comprehensive toolset for characterisation, debug and automated compliance test of Superspeed USB (USB 3.0) devices. 









